Short courses

Sunday June 9

Course 1 and 2, 14.00-18.00

Course 3, 13.00-18.00

Sign up for the courses when registering for the Conference
Please note that you can only attend ONE of the courses since they are sceduled at the same time

Short course 1

Quantitative XPS by visual inspection of the XPS survey and by QUASES software

ecasia2024
Instructor

Prof. Sven Tougaard,
University of Southern Denmark
(svt@sdu.dk)

The focus of Sven Tougaard´s research has for several years been experimental and theoretical studies to understand the energy loss processes experienced by electrons travelling nearby nanostructured surfaces. Based on this, he founded QUASES-Tougaard Inc. in 1994 which develops software for characterization of surface nanostructures by analysis of XPS and optical properties by analysis of REELS. He received the Rivière Prize awarded by the UK Surface Analysis Forum in 2007, “for work which has been judged outstanding in its continuing and lasting contribution to surface analysis”, and the Albert Nerken Award by the American Vacuum Society in 2012 “for contributions to the development of improved methods to characterize thin-film nanostructures by XPS”. He has conducted and participated in several international projects, published > 230 scientific papers which are cited more than 9000 times with an H-index = 47, and presented more than 60 invited talks at international conferences.

Audience

The short course is for students and researchers, working with XPS or HAXPES that want to understand how to best apply this for quantitative composition analysis.

Aim of the course

After the course, the participants will understand the limitations and deficiencies in traditional quantitative XPS. They will learn how the accuracy can be enhanced considerably by a simple visual inspection of the XPS survey spectrum. They will also be able to make more accurate and more detailed analysis of nano-structured surfaces by XPS and HAXPES, using the facilities in the QUASES software package.

Content of the course

The course consists of three sessions (~ 45 min each):

A lecture on quantitative XPS surface analysis. Discussing deficiencies in traditional quantitative XPS analysis and how the accuracy can be enhanced considerably by analysis of both peak intensity and the background of inelastically scattered electrons. First it is demonstrated, by several practical examples, how quantitative depth composition information can be obtained from a quick visual inspection of the survey XPS spectrum. Then it is discussed how more accurate and detailed quantitative determination of the surface nanostructure can be obtained with the QUASES software.
From raw spectra to final evaluation. The steps needed to get from the raw XPS spectra to the complete quantitative analysis of the nanostructure is demonstrated live. by practical examples such as, thin films: determination of the layered structure; thin film growth: accurate determination of layer thickness, coverage, and distribution of islands; Nano- particles: determination of NP size; coated nanoparticles: accurate determination of shell thickness, non-uniformity of shell thickness, and incomplete encapsulation of the core. HAXPES: determination of the position and thickness of deeply (up to ~200 nm) buried layers. Ambient Pressure XPS: removal of the spectral distortion caused by the ambient gas.
Discussion: answering your questions by practical demonstrations.

Additional information

For an introduction to QUASES XPS analysis, see:

quases.com
the set of tutorial videos at https://doi.org/10.5281/zenodo.5499741
“Practical guide to the use of backgrounds in quantitative XPS.” J Vac Sci Technol A. 2021;39:011201. https://avs.scitation.org/doi/10.1116/6.0000661
“HAXPES- inelastic background for characterization of nanostructured materials”, being published in SIA: https://www.researchgate.net/publication/376678856_HAXPES-inelastic_background_for_characterization_of_nanostructured_materials#fullTextFileContent

Participant fee:

Regular: SEK 1 700 ex. VAT

Student: SEK 1 350 ex. VAT

Short course 2

X-ray Photoelectron Spectroscopy Data Analysis Workshop ECASIA 2024

Instructor On-Site: Dr Vincent Fernandez (University of Nantes)

Remote Presentation: Dr Neal Fairley (Casa Software Ltd)

Remote Moderator: Dr Jonas Baltrusaitis (Lehigh University)

Course Objectives:

Introduction to treatment of XPS spectra. The workshop will be based around the following document, data and videos (links within pdf).

http://www.casaxps.com/SW-Workshop/PMMA/PMMA-Iterations.pdf

Data will be provided for the workshop to allow participants to follow the analysis steps that will be illustrated in real-time. Support for those wishing to follow the analysis steps in CasaXPS and present at ECASIA24 will be provided by Dr Vincent Fernandez. For those not able to join the workshop at ECASIA24 and are participating remotely via the Zoom meeting hosted by Lehigh University, support will be available via the chat stream.

Paper published since 2023 that provide further supporting information about the topics and instructors are as follows:

Fernandez, V., Morgan, D., Bargiela, P., Fairley, N., & Baltrusaitis, J. (2023). Combining PCA and nonlinear fitting of peak models to re-evaluate C 1s XPS spectrum of cellulose. Applied Surface Science, 614, 156182.

Fairley, N., Bargiela, P., Huang, W. M., & Baltrusaitis, J. (2023). Principal Component Analysis (PCA) unravels spectral components present in XPS spectra of complex oxide films on iron foil. Applied Surface Science Advances, 17, 100447.

Fairley, N., Compagnini, G., Scardaci, V., Baltrus, J., Roberts, A., Barlow, A., … & Baltrusaitis, J. (2023). Surface analysis insight note: Differentiation methods applicable to noisy data for determination of sp2‐versus sp3‐hybridization of carbon allotropes and AES signal strengths. Surface and Interface Analysis, 55(3), 165-175.

Fernandez, V., Fairley, N., & Baltrusaitis, J. (2023). Surface analysis insight note: Synthetic line shapes, integration regions and relative sensitivity factors. Surface and Interface Analysis, 55(1), 3-9.

Lizarbe, A. J., Major, G. H., Fernandez, V., Fairley, N., & Linford, M. R. (2023). Insight note: X‐ray photoelectron spectroscopy (XPS) peak fitting of the Al 2p peak from electrically isolated aluminum foil with an oxide layer. Surface and Interface Analysis, 55(9), 651-657.

Fairley, N., Bargiela, P., Roberts, A., Fernandez, V., & Baltrusaitis, J. (2023). Practical guide to understanding goodness-of-fit metrics used in chemical state modeling of x-ray photoelectron spectroscopy data by synthetic line shapes using nylon as an example. Journal of Vacuum Science & Technology A, 41(1).

Béchu, S., & Fairley, N. (2024). Determination of the X-Auger electron spectroscopy evolution of indium in InSb by linear and nonlinear least squares approaches. Journal of Vacuum Science & Technology A, 42(1).

Smith, E., Fairley, N., Licence, P., Jones, R., & Baltrusaitis, J. (2023). Modification of conventional peak shapes to accurately represent spectral asymmetry: High-Resolution X-ray photoelectron spectra of [C4C1Pyrr][NTf2] and [C8C1Im][NTf2] ionic liquids. Applied Surface Science, 611, 155314.

Bargiela, P., Fernandez, V., Morgan, D., Fairley, N., & Baltrusaitis, J. (2024). Surface science insight note: A linear algebraic approach to elucidate native films on Fe3O4 surface. Surface and Interface Analysis.

Fernandez, V., Renault, O., Fairley, N., & Baltrusaitis, J. (2024). Surface science insight note: Optimizing XPS instrument performance for quantification of spectra. Surface and Interface Analysis.

Fairley, N., Bargiela, P., & Baltrusaitis, J. (2024). Surface analysis insight note: Illustrating the effect of adventitious contamination on Pt photoemission peak intensities. Surface and Interface Analysis, 56(2), 122-125.

Bargiela, P., Fernandez, V., Morgan, D., Richard-Plouet, M., Fairley, N., & Baltrusaitis, J. Surface Chemistry of Ion Beam Modified Native Ti Foil Surfaces Examined Using X-Ray Photoelectron Spectroscopy. Available at SSRN 4379805.

Participant fee:

Regular: SEK 1 700 ex. VAT

Student: SEK 1 350 ex. VAT

Short course 3

“XPS/AES – principles, capabilities and applications” – CANCELLED

The course provides an overview of XPS/AES with dedicated approach to demonstrate the use of XPS/AES for selected applications. The course will also allow participants to bring their own topics for discussion on how to best address a specific analytical need.

The course will include hands-on demonstration on use of XPS and AES in surface analysis laboratory at Chalmers University of Technology.

Participant fee:

Regular: SEK 2 850 ex. VAT

Student: SEK 2 250 ex. VAT

CONFERENCE SECRETARIAT

Sweden Meetx AB is the conference bureau handling the conference secretariat for the ECASIA 2024 conference.

E-mail: ecasia2024@meetx.se

Phone: +46 31 708 86 90

IMPORTANT DATES

Registration opens: January 2024
Abstract submission deadline – April 5, 2024
Poster submission deadline – May 20, 2024
Early Bird Registration deadline – April 30, 2024
Conference Dates: 9-14 June 2024

Short courses

Sunday June 9

CONFERENCE SECRETARIAT

IMPORTANT DATES

ORGANIZERS